Snowball effect detection and control proposal for its correction

Sara Taborda, Diego A. Munoz, Hernan Alvarez

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    3 Scopus citations

    Abstract

    Snowball effect is a positive mass and energy feedback acting on a process. This effect complicates process control by activating variables interactions and nonlinear phenomena inherent to the process. Traditional process control structures are strongly affected by snowball, which means that to reject relatively small perturbations large changes in the manipulated variables are required. In several cases, operative limits are surpassed and one or more variables cause a process fault. Present work proposes a control structure that can operate more efficiently in process with a tendency to develop snowball effect. The control system has a collaborative control structure, which uses a hierarchical structure with two levels of action in accordance with a dynamic hierarchy. Original PID controllers of traditional control structure are left in plant-floor level but a collaborative level is put over it, acting as an optimizer of process actions. The control proposal is illustrated using a typical buffer tank-separation process, commonly found in process industries.

    Original languageEnglish
    Title of host publication2016 IEEE Conference on Control Applications, CCA 2016
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages1173-1178
    Number of pages6
    ISBN (Electronic)9781509007554
    DOIs
    StatePublished - 10 Oct 2016
    Event2016 IEEE Conference on Control Applications, CCA 2016 - Buenos Aires, Argentina
    Duration: 19 Sep 201622 Sep 2016

    Publication series

    Name2016 IEEE Conference on Control Applications, CCA 2016

    Conference

    Conference2016 IEEE Conference on Control Applications, CCA 2016
    Country/TerritoryArgentina
    CityBuenos Aires
    Period19/09/1622/09/16

    Bibliographical note

    Publisher Copyright:
    © 2016 IEEE.

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