In this paper a dynamic method of analysis of the reflectance is presented starting from a polychromatic interferometric system that allows establishing the content of materials to microscopic scale. The reflectance of the material is obtained starting from the distribution of Intensities in the optical contact of an interferometric microscope, where a device that can carry out displacements of the order of the nanometers in axial address was adapted, the interference pattern detection was carried out with a CCD in color. The determination of the local reflectivity realizes the presence of the materials that form the sample to microscopic, scale; given the nanotecnologys peak this method will allow to characterize with more resolution the composition of new materials.
|Número de páginas||4|
|Publicación||Proceedings of SPIE - The International Society for Optical Engineering|
|Estado||Publicada - 2001|